Piezoelectricity and Pyroelectricity of Thin Films of Polyurea Prepared by Vapor Deposition Polymerization

نویسندگان

چکیده

برای دانلود باید عضویت طلایی داشته باشید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Microstructure and optical properties of scandium oxide thin films prepared by metalorganic chemical-vapor deposition

Dense, high-index, and reproducible scandium oxide (Sc2O3) thin films with high mechanical strength were grown on glass substrates by metalorganic chemical-vapor deposition. The influence of deposition temperature on the microstructure evolution and optical properties of Sc2O3 thin films was investigated by x-ray diffraction, scanning electron microscopy, atomic-force microscopy, transmission e...

متن کامل

Potential phase control of chromium oxide thin films prepared by laser-initiated organometallic chemical vapor deposition

We have used laser-initiated chemical vapor deposition to grow the chromium oxide thin films through the oxidation of Cr~CO!6 in an oxygen environment. While both Cr2O3 and CrO2 are present in the film, the relative weight of each phase depends on the oxygen partial pressure. The Curie temperature of the film increases and approaches the bulk TC of CrO2 ~397 K! as the partial oxygen pressure is...

متن کامل

Deposition of Thin Films by Plasma Polymerization for Biomedical Application

This study represents a review of deposition of polyethylene oxide-like thin films by means of low pressure plasma discharges. Current state-of-the-art is discussed and novel approach based on plasma assisted vacuum thermal degradation is introduced together with the first experimental results reached using this technique.

متن کامل

Highly spin-polarized chromium dioxide thin films prepared by chemical vapor deposition from chromyl chloride

Highly spin-polarized chromium dioxide (CrO2) thin films were deposited on ~100! TiO2 substrates by chemical vapor deposition using chromyl chloride as a precursor. The spin polarization, as measured by the point contact Andreev reflection technique, was 8163%. X-ray diffraction u/2u scans indicated the films grew completely ~100! oriented, in registry with the ~100! oriented TiO2 substrate. X-...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: Sen'i Gakkaishi

سال: 1992

ISSN: 0037-9875,1884-2259

DOI: 10.2115/fiber.48.5_p264